Use HR-XRPD when you need sharp peak separation, reliable impurity detection, and robust structural analysis for crystalline or microcrystalline powders. The added resolution is especially valuable for polymorph screening, multi-phase mixtures, quantitative phase analysis, and Rietveld workflows where small peak overlaps can otherwise hide important information.
Measurement technique
High-resolution X-ray powder diffraction
High-resolution X-ray powder diffraction (HR-XRPD) is ideal for identification, refinement, and solution of microcrystalline structures. This technique provides a rapid diagnostic for detecting impurities, quantifying phases, determining molecular-scale and morphological properties of matter, and much more.
What information do you get out of it?
HR-XRPD helps you determine which crystalline phases are present, how much of each phase is in the sample, and how structural properties change with processing or composition. Depending on the system and analysis approach, it can reveal lattice parameters, crystallite size and strain trends, preferred orientation, site occupancies, and subtle differences between related structures.
Deliverables
Processed diffraction data in ready-to-use format
Experimental report with measurement conditions and quality summary
Starter files for phase identification and refinement workflows
Optional add-on analysis such as Rietveld refinement, QPA, and structure solution
Explore more
Other measurement techniques
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Use HR-XRPD in your next measurement campaign
Send your samples, choose the workflow that fits your material, and we will handle measurement, processing, and delivery.